Produktbild: Transmission Electron Microscopy
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Transmission Electron Microscopy A Textbook for Materials Science

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Beschreibung

Produktdetails

Einband

Gebundene Ausgabe

Erscheinungsdatum

05.08.2009

Verlag

Springer Us

Seitenzahl

775

Maße (L/B/H)

28,5/21,5/4,8 cm

Gewicht

2679 g

Auflage

2nd ed. 2009

Sprache

Englisch

ISBN

978-0-387-76500-6

Beschreibung

Rezension

From the reviews of the second edition:

“This book is intended to be used as a textbook for material science students studying the theory, operation, and application of the TEM. It is truly a book so thoughtfully written that … it will provide a solid foundation for those studying material science. It is richly illustrated with full-color figures and illustrations throughout the text. … There are an abundant number of references at the end of each chapter for further study … . This is an outstanding book … .” (IEEE Electrical Insulation Magazine, Vol. 26 (4), July/August, 2010)

“D.B. Williams and C.B. Carter have now prepared a new edition, splendidly produced by Springer with colour throughout. … This textbook is magnificent, written in a very readable style, immensely knowledgeable, drawing attention to difficulties and occasionally to unsolved problems. Any microscopist who has mastered … the book relevant to his projects will be well armed for battle. … Buy this book!” (P. W. Hawkes, Ultramicroscopy, Vol. 110, 2010)

Produktdetails

Einband

Gebundene Ausgabe

Erscheinungsdatum

05.08.2009

Verlag

Springer Us

Seitenzahl

775

Maße (L/B/H)

28,5/21,5/4,8 cm

Gewicht

2679 g

Auflage

2nd ed. 2009

Sprache

Englisch

ISBN

978-0-387-76500-6

Herstelleradresse

Springer-Verlag KG
Sachsenplatz 4-6
1201 Wien
AT

Email: GPSR Kontakt

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  • Produktbild: Transmission Electron Microscopy
  • Basics.- The Transmission Electron Microscope.- Scattering and Diffraction.- Elastic Scattering.- Inelastic Scattering and Beam Damage.- Electron Sources.- Lenses, Apertures, and Resolution.- How to ‘See’ Electrons.- Pumps and Holders.- The Instrument.- Specimen Preparation.- Diffraction.- Diffraction in TEM.- Thinking in Reciprocal Space.- Diffracted Beams.- Bloch Waves.- Dispersion Surfaces.- Diffraction from Crystals.- Diffraction from Small Volumes.- Obtaining and Indexing Parallel-Beam Diffraction Patterns.- Kikuchi Diffraction.- Obtaining CBED Patterns.- Using Convergent-Beam Techniques.- Imaging.- Amplitude Contrast.- Phase-Contrast Images.- Thickness and Bending Effects.- Planar Defects.- Imaging Strain Fields.- Weak-Beam Dark-Field Microscopy.- High-Resolution TEM.- Other Imaging Techniques.- Image Simulation.- Processing and Quantifying Images.- Spectrometry.- X-ray Spectrometry.- X-ray Spectra and Images.- Qualitative X-ray Analysis and Imaging.- Quantitative X-ray Analysis.- Spatial Resolution and Minimum Detection.- Electron Energy-Loss Spectrometers and Filters.- Low-Loss and No-Loss Spectra and Images.- High Energy-Loss Spectra and Images.- Fine Structure and Finer Details.