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Produktbild: Applied Scanning Probe Methods XI
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Applied Scanning Probe Methods XI Scanning Probe Microscopy Techniques

Aus der Reihe NanoScience and Technology
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142,99 € UVP 160,49 €

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Beschreibung

Produktdetails

Einband

Gebundene Ausgabe

Erscheinungsdatum

04.11.2008

Abbildungen

LVI, 113 illus., 22 illus. in color., schwarz-weiss Illustrationen, farbige Illustrationen

Herausgeber

Bharat Bhushan + weitere

Verlag

Springer Berlin

Seitenzahl

236

Maße (L/B/H)

24,1/16/2,1 cm

Gewicht

606 g

Auflage

2009

Sprache

Englisch

ISBN

978-3-540-85036-6

Beschreibung

Rezension

From the reviews:


"Vol. XI contains contributions about recent developments in scanning probe microscopy techniques. … The editors and their talented authors have been among the leaders in the study of probe methods. … Each chapter captures both the excitement and the importance of the work and conclusions reported, and will make profitable reading for researchers at all experience levels. … All the chapters are supported by extensive lists of references and beautifully illustrated and in color too, also along with graphs, equations etc." (Current Engineering Practice, 2009)

“The articles … are written in sufficient detail, so that university students, researchers and engineers can understand the physics of the instruments, the design and construction of the devices and the cantilevers, the signal processing algorithms, and their use in imaging and the surface characterization of the specimens. … SPM includes a variety of techniques, including scanning near-field optical microscopy, which has interesting applications … . well-written and clearly illustrated. … contain ample experimental data and significant discussion of limitations and artifacts.” (Barry R. Masters, Optics & Photonics News, September, 2009)

Produktdetails

Einband

Gebundene Ausgabe

Erscheinungsdatum

04.11.2008

Abbildungen

LVI, 113 illus., 22 illus. in color., schwarz-weiss Illustrationen, farbige Illustrationen

Herausgeber

Verlag

Springer Berlin

Seitenzahl

236

Maße (L/B/H)

24,1/16/2,1 cm

Gewicht

606 g

Auflage

2009

Sprache

Englisch

ISBN

978-3-540-85036-6

Herstelleradresse

Springer-Verlag KG
Sachsenplatz 4-6
1201 Wien
AT

Email: GPSR Kontakt

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  • Produktbild: Applied Scanning Probe Methods XI
  • Oscillation Control in Dynamic SPM with Quartz Sensors.- Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation.- Mechanical Diode-Based Ultrasonic Atomic Force Microscopies.- Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science.- Contact Resonance Force Microscopy Techniques for Nanomechanical Measurements.- AFM Nanoindentation Method: Geometrical Effects of the Indenter Tip.- Local Mechanical Properties by Atomic Force Microscopy Nanoindentations.- Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction.