Produktbild: Applied Scanning Probe Methods XII
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Applied Scanning Probe Methods XII Characterization

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Beschreibung

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

22.11.2010

Herausgeber

Bharat Bhushan + weitere

Verlag

Springer Berlin

Seitenzahl

224

Maße (L/B/H)

23,5/15,5/1,6 cm

Gewicht

429 g

Auflage

Softcover reprint of hardcover 1st edition 2009

Sprache

Englisch

ISBN

978-3-642-09870-3

Beschreibung

Rezension

From the reviews:


"Vol. XII contains nine contributions … of SPM applications on a variety of systems including biological systems for the measurement of receptor-ligand interaction, the imaging of chemical groups on living cells, and the imaging of chemical groups on live cells. These biological applications are complemented by nearfield optical microscopy in life science … . Each chapter … will make profitable reading for researchers at all experience levels. … All the chapters are … beautifully illustrated and in color too, also along with graphs, equations etc." (Current Engineering Practice, 2009)

“The articles … are written in sufficient detail, so that university students, researchers and engineers can understand the physics of the instruments, the design and construction of the devices and the cantilevers, the signal processing algorithms, and their use in imaging and the surface characterization of the specimens. … highlight various studies, techniques and applications that permit us to image, modify, fabricate and control structures at the molecular and atomic level. … well-written and clearly illustrated.” (Barry R. Masters, Optics & Photonics News, September, 2009)

Portrait

Dr. Bharat Bhushan received an M.S. in mechanical engineering from the Massachusetts Institute of Technology in 1971, an M.S. in mechanics and a Ph.D. in mechanical engineering from the University of Colorado at Boulder in 1973 and 1976, respectively, an MBA from Rensselaer Polytechnic Institute at Troy, NY in 1980, Doctor Technicae from the University of Trondheim at Trondheim, Norway in 1990, a Doctor of Technical Sciences from the Warsaw University of Technology at Warsaw, Poland in 1996, and Doctor Honoris Causa from the Metal-Polymer Research Institute of National Academy of Sciences at Gomel, Belarus in 2000. He is a registered professional engineer (mechanical) and presently an Ohio Eminent Scholar and The Howard D. Winbigler Professor in the Department of Mechanical Engineering, Graduate Research Faculty Advisor in the Department of Materials Science and Engineering, and the Director of the Nanotribology Laboratory for Information Storage & MEMS/NEMS (NLIM) at the Ohio State University, Columbus, Ohio. He is an internationally recognized expert of tribology on the macro- to nanoscales, and is one of the most prolific authors in the field. He is considered by some a pioneer of the tribology and mechanics of magnetic storage devices and a leading researcher in the fields of nanotribology and nanomechanics using scanning probe microscopy and applications to micro/nanotechnology.

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

22.11.2010

Herausgeber

Verlag

Springer Berlin

Seitenzahl

224

Maße (L/B/H)

23,5/15,5/1,6 cm

Gewicht

429 g

Auflage

Softcover reprint of hardcover 1st edition 2009

Sprache

Englisch

ISBN

978-3-642-09870-3

Herstelleradresse

Springer-Verlag GmbH
Tiergartenstr. 17
69121 Heidelberg
DE

Email: ProductSafety@springernature.com

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  • Produktbild: Applied Scanning Probe Methods XII
  • Direct Force Measurements of Receptor–Ligand Interactions on Living Cells.- Imaging Chemical Groups and Molecular Recognition Sites on Live Cells Using AFM.- Applications of Scanning Near-Field Optical Microscopy in Life Science.- Adhesion and Friction Properties of Polymers at Nanoscale: Investigation by AFM.- Mechanical Characterization of Materials by Micro-Indentation and AFM Scanning.- Mechanical Properties of Metallic Nanocontacts.- Dynamic AFM in Liquids: Viscous Damping and Applications to the Study of Confined Liquids.- Microtensile Tests Using In Situ Atomic Force Microscopy.- Scanning Tunneling Microscopy of the Si(111)-7×7 Surface and Adsorbed Ge Nanostructures.