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  • Produktbild: Scanning Probe Microscopy in Nanoscience and Nanotechnology
  • Produktbild: Scanning Probe Microscopy in Nanoscience and Nanotechnology

Scanning Probe Microscopy in Nanoscience and Nanotechnology

Aus der Reihe NanoScience and Technology

271,99 €

inkl. gesetzl. MwSt., Versandkostenfrei

Beschreibung

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

23.08.2016

Herausgeber

Bharat Bhushan

Verlag

Springer Berlin

Seitenzahl

956

Maße (L/B/H)

23,5/15,5/5,3 cm

Gewicht

1484 g

Auflage

Softcover reprint of the original 1st ed. 2010

Sprache

Englisch

ISBN

978-3-662-50220-4

Beschreibung

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

23.08.2016

Herausgeber

Bharat Bhushan

Verlag

Springer Berlin

Seitenzahl

956

Maße (L/B/H)

23,5/15,5/5,3 cm

Gewicht

1484 g

Auflage

Softcover reprint of the original 1st ed. 2010

Sprache

Englisch

ISBN

978-3-662-50220-4

Herstelleradresse

Springer-Verlag GmbH
Tiergartenstr. 17
69121 Heidelberg
DE

Email: GPSR Kontakt

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  • Produktbild: Scanning Probe Microscopy in Nanoscience and Nanotechnology
  • Produktbild: Scanning Probe Microscopy in Nanoscience and Nanotechnology
  • 1. Dynamic Force Microscopy and Spectroscopy using the Frequency-Modulation Technique in Air and Liquids.- 2. Colossal Permittivity in Advanced Functional Heterogeneous Materials: The Relevance of the Local Measurements at Submicron Scale.- 3. Scanning Probe Alloying Nanolithography.- 4. Controlling Wear on Nanoscale.- 5. Structural and Mechanical Mechanisms of Ocular Tissues Probed by AFM.- 6. Modern Atomic Force Microscopy and Its Application to the Study of Genome Architecture.- 7. Near-field Nanolitography.- 8. Photonic Force Microscopy: From Femtonewton Force Sensing to Ultra-Sensitive Spectroscopy.- 9. Simultaneous Topography and Recognition Imaging.- 10. Application of Contact Mode AFM to Manufacturing Processes.- 11. Mechanical Properties of One-dimensional Nanostructures.- 12. Contact Potential Difference Techniques as Probing Tools in Tribology and Surface Mapping.- 13. Force-extension (FX) and Force-clamp (FC) AFM Spectroscopies in Investigating Mechanochemical Reactions and Mechanical properties of Single Biomolecules.- 14. Scanning Probe Microscopy as a Tool Applied to Agriculture.- 15. Spin Charge Pairing Instabilities, Magnetism and Ferroelectricity in Nanoclusters, High-Tc Cuprates, Manganites and Multiferroic Nanomaterials.- 16. Combining Atomic Force Microscopy and Depth Sensing Instruments for the Nanometre Scale Mechanical Characterization of Soft Matter.- 17. Structuring the Surface of Crystallizable Polymers with an AFM Tip.- 18. Polarization-sensitive Tip-enhanced Raman Scattering.- 19. Static and Dynamic Structural Modeling Analysis of Atomic Force Microscope.- 20. Carbon Nanotube Atomic Force Microscopy with Applications to Biology and Electronics.- 21. Multilevel Experimental and Modelling Techniques for Bioartificial Scaffolds and Matrices.- 22. A New AFM Based Lithography Method: ThermoChemical NanoLithography.- 23. Novel Strategies to Probe the Fluid Properties and Revealing its Hidden Elasticity.- 24. Electrostatic Force Microscopy and Kelvin Force Microscopy as a Probe of the Electrostatic and Electronic Properties of Carbon Nanotubes.- 25. Quantized Mechanics of Nanotubes and Bundles.- 26. Experimental Methods for the Calibration of Lateral Forces in Atomic Force Microscopy.