Produktbild: Optical Techniques for Solid-State Materials Characterization

Optical Techniques for Solid-State Materials Characterization

64,99 €

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Beschreibung

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

30.06.2020

Herausgeber

Rohit P. Prasankumar + weitere

Verlag

Taylor & Francis

Seitenzahl

748

Maße (L/B/H)

25,4/17,8/3,4 cm

Gewicht

1380 g

Sprache

Englisch

ISBN

978-0-367-57692-9

Beschreibung

Rezension

This book has comprehensively covered the essential optical approaches needed for solid-state materials characterization. Written by experts in the field, this will be a great reference for students, engineers, and scientists.
-Professor Yoke Khin Yap, Michigan Technical University

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

30.06.2020

Herausgeber

Verlag

Taylor & Francis

Seitenzahl

748

Maße (L/B/H)

25,4/17,8/3,4 cm

Gewicht

1380 g

Sprache

Englisch

ISBN

978-0-367-57692-9

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  • Produktbild: Optical Techniques for Solid-State Materials Characterization
  • BACKGROUND: Light-Matter Interactions. Semiconductors and Their Nanostructures. The Optical Properties of Metals: From Wideband to Narrowband Materials. LINEAR OPTICAL SPECTROSCOPY: Methods for Obtaining the Optical Constants of a Material. Methods for Obtaining the Optical Response after CW Excitation. Raman Scattering as a Tool for Studying Complex Materials. TIME-RESOLVED OPTICAL SPECTROSCOPY: Ultrashort Pulse Generation and Measurement. Carrier Dynamics in Bulk Semiconductors and Metals after Ultrashort Pulse Excitation. Ultrafast Pump-Probe Spectroscopy. Transient Four-Wave Mixing. Time-Domain and Ultrafast Terahertz Spectroscopy. Time-Resolved Photoluminescence Spectroscopy. Time-Resolved Magneto-Optical Spectroscopy. Time-Resolved Raman Scattering. SPATIALLY RESOLVED OPTICAL SPECTROSCOPY: Microscopy. Micro-Optical Techniques. Near-Field Scanning Optical Microscopy. RECENT DEVELOPMENTS: Recent Developments in Spatially and Temporally Resolved Optical Characterization of Solid-State Materials. Index.