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Advances in X-Ray Analysis Volume 27

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74,99 € UVP 85,55 €

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Beschreibung

Produktdetails

Einband

Gebundene Ausgabe

Erscheinungsdatum

01.06.1984

Verlag

Springer Us

Seitenzahl

596

Gewicht

1200 g

Auflage

1984 edition

Sprache

Englisch

ISBN

978-0-306-41712-2

Beschreibung

Produktdetails

Einband

Gebundene Ausgabe

Erscheinungsdatum

01.06.1984

Verlag

Springer Us

Seitenzahl

596

Gewicht

1200 g

Auflage

1984 edition

Sprache

Englisch

ISBN

978-0-306-41712-2

Herstelleradresse

Libri GmbH
Europaallee 1
36244 Bad Hersfeld
DE

Email: GPSR Kontakt

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  • Produktbild: Advances in X-Ray Analysis
  • Produktbild: Advances in X-Ray Analysis
  • I. J. D. Hanawalt Award Session On Search/Match Methods.- Establishment of the J. D. Hanawalt Award for Excellence in Powder Diffraction and its First Presentation to Ludo K. Frevel.- J. D. Hanawalt Powder Diffraction Award Lecture.- Presentation of the J. D. Hanawalt Award.- Computer Techniques for Faster X-Ray Diffraction Phase Identification.- Fuzzy Sets and Inverted Search—Two Concepts for Compound Identification in Spectra.- PDF Search and Match Algorithms for the Cyber 205 Vector Processor.- A Method of Background Subtraction for the Analysis of Broadened Profiles.- A Combined Derivative Method for Peak Search Analysis.- Experimental Study of Precise Peak Determination in X-Ray Powder Diffraction.- Evaluation of Existing X-Ray Powder Diffraction Standards for Phosphate Minerals.- Data Sets for Evaluation of Powder Diffraction Search/Match Algorithms.- Computer Simulation of Powder Patterns.- II. X-Ray Strain and Stress Determination.- A Useful Guide for X-Ray Stress Evaluation (XSE).- Stress Evaluation on Materials Having Non-Linear Lattice Strain Distributions.- X-Ray Multiaxial Stress Analysis Taking Account of Stress Gradient.- Determining Stresses in the Presence of Nonlinearities in Interplanar Spacing vs. sin2?.- On the Use of Synchrotron Radiation for the Study of the Mechanical Behaviour of Materials.- The Measurement of Elastic Constants for the Determination of Stresses by X-Rays.- X-Ray Strain Measurements in IV-VI-Semiconductor Superlattices at Low Temperature.- Recent Applications of XSA in Heat Treatment and Fatigue of Steels.- Stress Measurement at Fatigue Crack Tip Using PSPC.- Direct X-Ray Measurement of Residual Strains in Textured Steel.- A Study of Plastic Flow and Residual Stress Distribution Caused by Rolling Contact.- X-Ray Fractography on Stress Corrosion Cracking of High Strength Steel.- Determination of Residual Stresses in Transformation-Toughened Ceramics.- Small Area X-Ray Diffraction Techniques; Applications of the Micro-Diffractometer to Phase Identification and Strain Determination.- Residual Stress Relaxation in Cemented Carbide Composites Studied Using the Argonne Intense Pulsed Neutron Source.- Stress Determination in an Adhesive Bonded Joint by X-Ray Diffraction.- III. Position Sensitive Detectors and X-Ray Instrumentation.- Evaluation of Straight and Curved Braun Position-Sensitive Proportional Counters on a Huber-Guinier X-Ray Diffraction System.- A New In Situ, Automatic, Strain-Measuring X-Ray Diffraction Apparatus with PSD.- A Miniature Instrument for Residual Stress Measurement.- A Low-High Temperature Camera for In-Situ X-Ray Diffraction Studies of Catalysts.- A Low Cost Rejuvenation of Old G.E. and Picker X-Ray Generators.- An Inexpensive In-House EXAFS Spectrometer.- Suppression of X-Ray Fluorescence Background in X-Ray Powder Diffraction by a Mercuric Iodide Spectrometer.- Computer-Assisted Alignment of a Guinier X-Ray Powder Diffraction System.- Energy Dispersive Diffraction in a Diamond Anvil High Pressure Cell Using Synchrotron and Conventional X-Radiation.- IV. Quantitative Phase Analysis by XRD.- Reference Intensity Quantitative Analysis Using Thin-Layer Aerosol Samples.- Quantitative Analysis: A Comparative Study Using Mo and Cu Radiation on Coal Related Minerals and Fly Ash.- Multiphase Quantitative Analysis of Colorado Oil Shales Involving Overlap of the Diffraction Peaks.- V. Other XRD Applications.- Evidence for Stacking Faults in Multiaxial Strained Alpha-Brass.- Line Broadening Studies on Highly Defective A12O3 Produced by High Pressure Shock Loading.- Line Broadening Studies on Highly Defective TiO2 Produced by High Pressure Shock Loading.- Examination of the Reaction Kinetics at Solder-Metal Interfaces Via High Temperature X-Ray Diffraction.- High Temperature Guinier X-Ray Diffractometry for Thermal Expansion Measurements in the Hexagonal Form of Cordierite (2MgO·2A12O3·5SiO2).- VI. J. Gilfrich Honorary Session on Trends in XRF Instrumentation.- Continuing Development of Mercuric Iodide X-Ray Spectrometry.- X-Ray Tube Improvements for Better Performance in an Energy-Dispersive X-Ray Spectrometer System.- Comparison of Experimental and Theoretical Intensities for a New X-Ray Tube for Light Element Analysis.- Using a Microcomputer-Controlled Robot Arm as a General Purpose Sample Changer.- VII. Mathematical Models and Computer Applications in XRF.- LAMA III — A Computer Program for Quantitative XRFA of Bulk Specimens and Thin Film Layers.- An Empirical Background Calculation Method for Multi-Channel X-Ray Spectrometers.- Comparison of X-Ray Backscatter Parameters for Complete Sample Matrix Definition.- VIII. Applications of XRF to Archeological, Geochemical and Industrial Materials.- Investigation of Obsidian by Radioisotope X-Ray Fluorescence.- A Comparison of Trace Metal Determinations in Contaminated Soils by XRF and ICAP Spectroscopies.- Determination of Barium and Selected Rare-Earth Elements in Geological Materials Employing a HpGe Detector by Radioisotope Excited X-Ray Fluorescence.- A Versatile XRF Analytical System for Geochemical Exploration and ether Applications.- XRF Analysis of Low Level Cation Concentration of Sodium Silicate Solutions.- A Rapid, Low Cost, Manual Fusion Sample Preparation Technique for Quantitative X-Ray Fluorescence Analysis.- Quantitative X-Ray Fluorescence Analysis for Fly Ash Samples.- IX. Other XRF Applications.- Polarization of X-Rays by Scattering from the Interior of a Cylinder I. Single Scatter.- Polarization of X-Rays by Scattering from the Interior of a Cylinder II. Double Scatter.- Application of a Polarized X-Ray Spectrometer for Analysis of Ash from a Refuse-Fired Steam Generating Facility.- Applications of Room Temperature Energy Dispersive X-Ray Spectrometry Using a Mercuric Iodide Detector.- Wall Effect and Detection Limit of the Proportional Counter Spectrometer.- Determination of Oxygen and Nitrogen in Various Materials by X-Ray Fluorescence Spectrometry.- Trace Element Analysis by Synchrotron Radiation Excited XRF.- X-Ray Fluorescence Spectrometric Analysis of Uncontaminated and Contaminated Tropical Plant Materials for Traces of Heavy Metals.- Author Index.