Produktbild: Applied Scanning Probe Methods III

Applied Scanning Probe Methods III Characterization

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Beschreibung

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

12.02.2010

Abbildungen

XLIV, 270 illus., 2 illus. in color., schwarz-weiss Illustrationen, farbige Illustrationen

Herausgeber

Bharat Bhushan + weitere

Verlag

Springer Berlin

Seitenzahl

378

Maße (L/B/H)

23,5/15,5/2,3 cm

Gewicht

639 g

Auflage

Softcover reprint of hardcover 1st ed. 2006

Sprache

Englisch

ISBN

978-3-642-06596-5

Beschreibung

Rezension

From the reviews:



"The editors have done a good job in making the various chapters quite readable and most of the chapters are well written on a level that will be accessible to most readers. … As is usually the case with Springer books, these volumes have been beautifully printed, illustrated, and nicely bound for long term durability." (Gary J. Long & Fernande Grandjean, Physicalia Magazine, Vol. 29 (4), 2007

Portrait

Dr. Bharat Bhushan received an M.S. in mechanical engineering from the Massachusetts Institute of Technology in 1971, an M.S. in mechanics and a Ph.D. in mechanical engineering from the University of Colorado at Boulder in 1973 and 1976, respectively, an MBA from Rensselaer Polytechnic Institute at Troy, NY in 1980, Doctor Technicae from the University of Trondheim at Trondheim, Norway in 1990, a Doctor of Technical Sciences from the Warsaw University of Technology at Warsaw, Poland in 1996, and Doctor Honoris Causa from the Metal-Polymer Research Institute of National Academy of Sciences at Gomel, Belarus in 2000. He is a registered professional engineer (mechanical) and presently an Ohio Eminent Scholar and The Howard D. Winbigler Professor in the Department of Mechanical Engineering, Graduate Research Faculty Advisor in the Department of Materials Science and Engineering, and the Director of the Nanotribology Laboratory for Information Storage & MEMS/NEMS (NLIM) at the Ohio State University, Columbus, Ohio. He is an internationally recognized expert of tribology on the macro- to nanoscales, and is one of the most prolific authors in the field. He is considered by some a pioneer of the tribology and mechanics of magnetic storage devices and a leading researcher in the fields of nanotribology and nanomechanics using scanning probe microscopy and applications to micro/nanotechnology.

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

12.02.2010

Abbildungen

XLIV, 270 illus., 2 illus. in color., schwarz-weiss Illustrationen, farbige Illustrationen

Herausgeber

Verlag

Springer Berlin

Seitenzahl

378

Maße (L/B/H)

23,5/15,5/2,3 cm

Gewicht

639 g

Auflage

Softcover reprint of hardcover 1st ed. 2006

Sprache

Englisch

ISBN

978-3-642-06596-5

Herstelleradresse

Springer-Verlag KG
Sachsenplatz 4-6
1201 Wien
AT

Email: GPSR Kontakt

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  • Produktbild: Applied Scanning Probe Methods III
  • Atomic Force Microscopy in Nanomedicine.- Scanning Probe Microscopy: From Living Cells to the Subatomic Range.- Surface Characterization and Adhesion and Friction Properties of Hydrophobic Leaf Surfaces and Nanopatterned Polymers for Superhydrophobic Surfaces.- Probing Macromolecular Dynamics and the Influence of Finite Size Effects.- Investigation of Organic Supramolecules by Scanning Probe Microscopy in Ultra-High Vacuum.- One- and Two-Dimensional Systems: Scanning Tunneling Microscopy and Spectroscopy of Organic and Inorganic Structures.- Scanning Probe Microscopy Applied to Ferroelectric Materials.- Morphological and Tribological Characterization of Rough Surfaces by Atomic Force Microscopy.- AFM Applications for Contact and Wear Simulation.- AFM Applications for Analysis of Fullerene-Like Nanoparticles.- Scanning Probe Methods in the Magnetic Tape Industry.