Produktbild: Transmission Electron Microscopy
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Transmission Electron Microscopy The Companion Volume

68,99 €

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Beschreibung

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

12.06.2027

Abbildungen

XXXIII, 809 p. 515 illus., 330 illus. in color.

Herausgeber

C. Barry Carter + weitere

Verlag

Springer

Seitenzahl

809

Maße (L/B)

27,9/21 cm

Auflage

Second Edition 2026

Sprache

Englisch

ISBN

978-3-031-80791-6

Beschreibung

Portrait


C. Barry Carter has been one of four CINT Distinguished Affiliate Scientists at Sandia and Los Alamos National Laboratories (2012-). He is a Research Professor in Chemical and Biomolecular Engineering and an Emeritus Professor in Materials Science and Engineering at the University of Connecticut having previously been the Inaugural 3M Harry Helzer Endowed Chair at the University of Minnesota (1991-2007) and a Professor at Cornell University (1079-1991). He served as the Editor-in-Chief of the Journal of Materials Science for 21 years from 2004-2024.


Dave Williams is emeritus dean of engineering and at The Ohio State University, where he is building global university-industry partnerships to support Starlab, a commercial space station planned for launch in 2028-29. Starlab is a joint venture between Voyager Space, Airbus and Mitsubishi Corporation along with Hilton, Northrop Grumman, Palantir and MDA to design build and manage the station. Starlab’s Ground Location (US) is at Ohio State University’s airport which will be the site of the George Washington Carver (Space) Science Park.

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

12.06.2027

Abbildungen

XXXIII, 809 p. 515 illus., 330 illus. in color.

Herausgeber

Verlag

Springer

Seitenzahl

809

Maße (L/B)

27,9/21 cm

Auflage

Second Edition 2026

Sprache

Englisch

ISBN

978-3-031-80791-6

Herstelleradresse

Libri GmbH
Europaallee 1
36244 Bad Hersfeld
DE

Email: GPSR Kontakt

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  • Produktbild: Transmission Electron Microscopy

  • Electron Sources.- FIB of TEM Specimens.- In-Situ and
    Operando
    Experiments.- Applying a Stimulus to the Specimen.- In-Situ Irradiation.- Cryogenic Electron Microscopy.- Electron Diffraction and Phase Identification.- CBED: Symmetry and Large-Angle Patterns.- Electron Crystallography, Charge-Density Mapping and Nanodiffraction.- DigitalMicrograph.- Electron Waves, Interference & Coherence.- Electron Holography.- Focal-Series Reconstruction (FSR).- Single Atom Counting in HREM.- Quantitative STEM.- Imaging in the STEM.- 4D STEM.- Nanoparticle Characterization.- Electron Tomography (ET).- EFTEM.- Calculating EELS.- Diffraction AND X-ray Excitation.- X-ray and EELS Imaging.- Practical Aspects and Advanced Applications of XEDS.