Advances in X-Ray Analysis Volume 9 Proceedings of the Fourteenth Annual Conference on Applications of X-Ray Analysis Held August 25–27, 1965
-
- Hardcover
- Taschenbuch ausgewählt
- eBook
-
Sprache:Englisch
-
Auflage:1966
- Softcover reprint of the original 1st ed. 1984 49,99 €
- Softcover reprint of the original 1st ed. 1962 48,99 €
- Softcover reprint of the original 1st ed. 1961 93,99 €
- Softcover reprint of the original 1st ed. 1982 49,99 €
- Softcover reprint of the original 1st ed. 1960 48,99 €
- Softcover reprint of the original 1st ed. 1960 48,99 €
- Softcover reprint of the original 1st ed. 1988 49,99 €
- Softcover reprint of the original 1st ed. 1987 49,99 €
- Softcover reprint of the original 1st ed. 1965 48,99 €
- Softcover reprint of the original 1st ed. 1964 92,99 €
- Softcover reprint of the original 1st edition 1990 48,99 €
- Softcover reprint of the original 1st ed. 1985 49,99 €
- 1991 49,99 €
- Softcover reprint of the original 1st ed. 1963 48,99 €
- Softcover reprint of the original 1st ed. 1969 49,99 €
- Softcover reprint of the original 1st ed. 1967 48,99 €
- Softcover reprint of the original 1st ed. 1994 48,99 €
- Softcover reprint of the original 1st ed. 1993 49,99 €
- Softcover reprint of the original 1st ed. 1992 49,99 €
- 1966 49,99 € ausgewählt
49,99 €
inkl. gesetzl. MwSt.,
Beschreibung
Produktdetails
Einband
Taschenbuch
Erscheinungsdatum
08.10.2012
Verlag
Springer UsSeitenzahl
544
Maße (L/B/H)
25,4/17,8/3 cm
Gewicht
1053 g
Auflage
1966
Sprache
Englisch
ISBN
978-1-4684-7635-4
The papers presented in this volume of Advances in X-Ray Analysis were chosen from those presented at the Fourteenth Annual Conference on the Applications of X-Ray Analysis. This conference, sponsored by the Metallurgy Division of the Denver Research Institute, University of Denver, was held on August 24,25, and 26, 1965, at the Albany Hotel in Denver, Colorado. Of the 56 papers presented at the conference, 46 are included in this volume; also included is an open discussion held on the effects of chemical com bination on X-ray spectra. The subjects presented represent a broad scope of applications of X-rays to a variety of fields and disciplines. These included such fields as electron-probe microanalysis, the effect of chemical combination on X-ray spectra, and the uses of soft and ultrasoft X-rays in emission analysis. Also included were sessions on X-ray diffraction and fluor escence analysis. There were several papers on special topics, including X-ray topography and X-ray absorption fine-structure analysis. William L. Baun contributed considerable effort toward the conference by organizing the session on the effect of chemical combination on X-ray spectra fine structure. A special session was established through the excellent efforts of S. P. Ong on the uses and applica tions of soft X-rays in fluorescent analysis. We offer our sincere thanks to these men, for these two special sessions contributed greatly to the success of the conference.
Kundinnen und Kunden meinen
Verfassen Sie die erste Bewertung zu diesem Artikel
Helfen Sie anderen Kund*innen durch Ihre Meinung
Kurze Frage zu unserer Seite
Vielen Dank für Ihr Feedback
Wir nutzen Ihr Feedback, um unsere Produktseiten zu verbessern. Bitte haben Sie Verständnis, dass wir Ihnen keine Rückmeldung geben können. Falls Sie Kontakt mit uns aufnehmen möchten, können Sie sich aber gerne an unseren Kund*innenservice wenden.
zum Kundenservice