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  • Produktbild: Advances in X-Ray Analysis
  • Produktbild: Advances in X-Ray Analysis

Advances in X-Ray Analysis Volume 12: Proceedings of the Seventeenth Annual Conference on Applications of X-Ray Analysis Held August 21–23, 1968

49,99 €

inkl. gesetzl. MwSt., Versandkostenfrei

Beschreibung

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

29.04.2012

Verlag

Springer Us

Seitenzahl

648

Maße (L/B/H)

25,4/17,8/3,6 cm

Gewicht

1228 g

Auflage

Softcover reprint of the original 1st ed. 1969

Sprache

Englisch

ISBN

978-1-4684-7537-1

Beschreibung

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

29.04.2012

Verlag

Springer Us

Seitenzahl

648

Maße (L/B/H)

25,4/17,8/3,6 cm

Gewicht

1228 g

Auflage

Softcover reprint of the original 1st ed. 1969

Sprache

Englisch

ISBN

978-1-4684-7537-1

Herstelleradresse

Springer-Verlag GmbH
Tiergartenstr. 17
69121 Heidelberg
DE

Email: ProductSafety@springernature.com

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  • Produktbild: Advances in X-Ray Analysis
  • Produktbild: Advances in X-Ray Analysis
  • Close-Packed Ordered Structures.- Crystal Chemistry of Rapidly Quenched (Splat Cooled) Metastable Alloy Phases.- Diffraction Analysis of Structural Disorder in Alloys.- Proton Scattering from Single Crystals.- Determination of Particle Size Distribution in a Dispersion Hardened Nickel Alloy Using Small Angle X-Ray Scattering.- A Study of G.P. Zone Growth Kinetics Through the Use of X-Ray Small Angle Scattering.- Changes in the Bragg-Williams Parameter with Deformation in Ordered Au4V.- Antiphase Domains in Long-Period Superlattices.- A Dynamical Theory Approach to the Berg-Barrett Technique.- Observation of Dislocations in Alpha-Arsenic Single Crystals by X Ray Diffraction Topography.- Instantaneous Display of X-Ray Diffraction Using a Diode Array Camera Tube.- Kossel Line Micro-Diffraction Study of Precipitation of Alpha from Beta in Copper-Zinc Alloys.- A High-Precision Kossel Camera for Research and Routine Analytical Use.- A New Method for Rourier Analysis of Shapes of X-Ray Peaks and Its Application to Line broadening and Integrated Intensity.- X-Ray Analysis of Fatigue Softening in Cold Water Copper.- Observation of the Distinct X-Ray Intensity Peaks Due to a Stacking Fault Structure in Plastically Deformed Alpha-Brass.- A General Computer Program for Particte Size and Strain Analysis.- X-Ray Diffraction Study of the Effects of Uniaxial Plastic Deformation on Residual Stress Measurements.- Role of Residual Stresses as Determined by X-Ray Diffractometry on Magnetic Properties of 4–79 Molybdenum Permalloys.- X-Ray Studies of Plastically Deformed Silver Alloys — Effects Due to Oxygen, Hydrogen, and Tin Solutes.- An X-Ray Line Shape Study of HO 9-4-45 Bainites and Martensites.- Precise Cell Parameters of Semiconductor Crystals and Their Applications.- Direct Determination of the Reciprocal Lattice Spacing and the Radial Interference Distribution by the Fourier Method.- Deformation Textures of Ordered and Disordered Cu3Au.- Direct Printout of X-Ray Pole Figures from Digital Computers.- A Computer-Controlled X-Ray Diffractometer for Texture Studies of Polycrystalline Materials.- Homogeneity Characterization of NBS Spectrometric Standards IV: W-20% MO Prepared by Powder Metallurgical Methods.- Solution Absorptiometry with Beta Excited Sources by Means of Balanced Filters.- Theoretical Formulas for Film Thickness Measurement by Means of Fluorescence X-Rays.- Measurement of Thin Oxide Surface Film Thicknesses and Atomic Densities by the Analysis of Positive Ion Excited Soft X-Ray Spectra.- Some Recent Work in Low Energy X-Ray and Electron Analysis.- A Total Reflection X-Ray Spectrograph for Fluorescence Analysis of Light Elements.- X-Ray Spectroscopic Studies of Bonding in Iron Germanides.- Simple Two Crystal Spectrometer and its Application to X-Ray Spectrochemical Analysis.- A Correction Method for Elemental Interactions and Physical Effects in the X-Ray Fluorescence Analysis of Silicate Powders.- A Rapid and Accurate X-Ray Determination of the Rare Earths Elements in Solid or Liquid Materials Using the Double Dilution Method.- Quantitative Microanalysis of Refractory Metal Carbide.- Solid Solutions of Cadmium Sulfide-Cadmium Selenide Films: Preparation and Determination by X-Ray Fluorescence Method.- Determination of Argon in RF-Sputtered SiO2 Through X-Ray Emission.- Particle Size Effects in Radioisotope X-Ray Analysis of Powdered Solids and Slurries.- Author Index.