Vor Ort
Merkzettel Warenkorb
  • Produktbild: Advances in X-Ray Analysis
  • Produktbild: Advances in X-Ray Analysis

Advances in X-Ray Analysis Volume 3 Proceedings of the Eighth Annual Conference on Applications of X-Ray Analysis Held August 12–14, 1959

48,99 €

inkl. gesetzl. MwSt., Versandkostenfrei

Beschreibung

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

18.04.2012

Verlag

Springer Us

Seitenzahl

376

Maße (L/B/H)

22,9/15,2/2,1 cm

Gewicht

561 g

Auflage

Softcover reprint of the original 1st ed. 1960

Sprache

Englisch

ISBN

978-1-4684-7403-9

Beschreibung

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

18.04.2012

Verlag

Springer Us

Seitenzahl

376

Maße (L/B/H)

22,9/15,2/2,1 cm

Gewicht

561 g

Auflage

Softcover reprint of the original 1st ed. 1960

Sprache

Englisch

ISBN

978-1-4684-7403-9

Herstelleradresse

Springer-Verlag GmbH
Tiergartenstr. 17
69121 Heidelberg
DE

Email: GPSR Kontakt

Noch keine Bewertungen vorhanden

Verfassen Sie die erste Bewertung zu diesem Artikel

Helfen Sie anderen Kundinnen und Kunden durch Ihre Meinung.

Kundinnen und Kunden meinen

Bewertungen (0)
  • Produktbild: Advances in X-Ray Analysis
  • Produktbild: Advances in X-Ray Analysis
  • Analysis of Aluminum — Nickel Diffusion Couples by X-Ray Absorption.- Applications of Optical and Electronic Dispersion to X-Ray Absorption-Edge Spectrometry.- A Versatile 19-cm-Diameter Low-Temperature Debye-Scherrer Camera.- The Universal Vacuum Spectrograph and Comparative Data on the Intensities Observed in an Air, Helium, and Vacuum Path.- The Norelco Portable Spectrometer (Portospec).- An X-Ray Camera for Precision Lattice Parameter Measurements.- The Establishment of a Q Rating Factor for Decorative Chromium Plate by X-Ray Fluorescence.- Count Distribution and Precision in X-Ray Fluorescence Analysis.- Intensities of the K, L, and M Spectral Lines for the Elements with Atomic Numbers 16 to 92.- The Direct Determination of Vanadium and Nickel in Crude Oils by X-Ray Fluorescence.- A Highly Simplified Multielement Calibration System for Semiquantitative X-Ray Spectrographic Analysis.- An X-Ray Fluorescence Method of Analysis of Microsamples.- X-Ray Spectrographic Analysis of Manganese Nodules.- Instrumentation for Electron Probe Microanalysis.- Metallurgical Applications of Electron Probe Microanalysis.- An Introduction to Total Reflection X-Ray Microscopy.- Differentiation of Several Related Ceramic Bodies by X-Ray Diffraction.- Integrated X-Ray Diffraction Intensities from Single Crystals.- Some Irradiation Effects in Nonmetallic Crystals.- X-Ray Methods for Detection of Lattice Imperfections in Crystals.- Textures in Extruded Uranium.- Precision X-Ray Stress Analysis of Uranium and Zirconium.- Influence of Goniometrie Arrangement and Absorption in Qualitative and Quantitative Analysis of Powders by X-Ray Diffractometry.- The Application of X-Ray Diffraction to Medical Problems.- A High-Temperature Study of Phase Precipitation in Superalloys.