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  • Produktbild: Advances in X-Ray Analysis
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Advances in X-Ray Analysis Volume 10

48,99 €

inkl. gesetzl. MwSt., Versandkostenfrei

Beschreibung

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

12.06.2012

Verlag

Springer Us

Seitenzahl

558

Maße (L/B/H)

25,4/17,8/3,1 cm

Gewicht

1062 g

Auflage

Softcover reprint of the original 1st ed. 1967

Sprache

Englisch

ISBN

978-1-4684-7837-2

Beschreibung

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

12.06.2012

Verlag

Springer Us

Seitenzahl

558

Maße (L/B/H)

25,4/17,8/3,1 cm

Gewicht

1062 g

Auflage

Softcover reprint of the original 1st ed. 1967

Sprache

Englisch

ISBN

978-1-4684-7837-2

Herstelleradresse

Springer-Verlag GmbH
Tiergartenstr. 17
69121 Heidelberg
DE

Email: ProductSafety@springernature.com

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  • Produktbild: Advances in X-Ray Analysis
  • Produktbild: Advances in X-Ray Analysis
  • X-Ray Diffraction Topography.- Contrast of Dislocation Images in X-Ray Transmission Topography.- The Asymmetric Bragg Reflection and Its Application in Double Diffractometry.- Experimental Determination of the Integrated Contribution of Temperature Diffuse Scattering in X-Ray Reflections.- The X-Ray Diffraction Image of a Stacking Fault.- Dynamical Theory for Simultaneous X-Ray Diffraction.- Measuring Techniques of Parallel-Beam-Diffraction Micrography.- Some Recent Applications of X-Ray Topography.- The Dilemma of Anomalous X-Ray Reflections.- X-Ray Diffraction Microscopy of Planar Diffused Junction Structures.- Experimental Procedures in X-Ray Diffraction Topography.- X-Ray Diffraction Contrast from Impurity Precipitates in CdS Single Crystals.- Lang X-Ray Topographic Studies of Ruby Grown by Different Methods.- The Analysis of Berg-Barrett Skew Reflections and Their Applications in the Observation of Process-Induced Imperfections in (111) Silicon Wafers.- The Effect of Small Additions of Magnesium on the Preprecipitation Behavior of Al-Zn Alloys.- Analysis of High Angle Diffuse Scattering from Small Platelets.- X-Ray Diffraction Study of Ordering in Two Sigma Phases.- A Study of the Unusual Line Structure in Powder Patterns of Pyrolytically Deposited Boron Compounds and Other Materials.- The Expansion upon Cooling of Thick Cu2O Films Grown on Copper Substrates.- New Results on the Iron-Nickel Equilibrium Diagram—The Gamma/Gamma-Plus-Alpha Boundary.- Lattice Constant and Crystallite Size of Condensed Gold Vapor.- Line Shape Analysis of Deformed Cu-Ge Alloys.- Anomalous Residual Stresses.- Experimental Factors Concerning X-Ray Residual Stress Measurements in High-Strength Aluminum Alloys.- X-Ray Measurement of Residual Stresses in Titanium Alloy Sheet.- The Application of X-Ray Diffraction Techniques to the Study of Wear.- X-Ray Analysis of Fatigue Damage in Copper.- Improvement of Accuracy in Representation of Conventional Pole Figures.- Precision Lattice Parameter Determination at Liquid Helium Temperatures by Double-Scanning Diffractometry.- Numerical Control X-Ray Powder Diffractometry.- The Effects of Electronic Structure and Interatomic Bonding on the Soft X-Ray Al K Emission Spectrum from Aluminum Binary Systems.- Multilayer Soap Film Structures.- Production Efficiencies of X-Ray Emission Spectra by Proton Bombardment.- Electron Microprobe Analyses and X-Ray Diffraction Study of SrSi2.- The Application of the Electron Microprobe in the Analysis of Nuclear Fuel Meltdown Experiments.- Preparation of Electron Probe Microanalyzer Standards Using a Rapid Quench Method.- Quantitative Microprobe Analysis by Means of Target Current Measurements.- A Comparison of Four Slit Apertures for Selected-Area Analysis with the X-Ray Secondary-Emission Spectrometer.- The Analysis of the Light Elements in Ferrotitanium Ores and Residues of Widely Varying Composition by X-Ray Spectrography.- A Glass Fusion Method for X-Ray Fluorescence Analysis.- Quantitative X-Ray Emission Analysis of Magnesium Through Fluorine with X-Ray and Electron Excitation.- A Method of Liquid Analyses Providing Increased Sensitivity for Light Elements.- The Demountable Tube in Light Element Fluorescence Analysis.- Characteristics of Flow Proportional Counters for X-Rays.- Author Index.