Vor Ort
Merkzettel Warenkorb
Produktbild: Advances in X-Ray Analysis

Advances in X-Ray Analysis Volume 32

195,99 €

inkl. gesetzl. MwSt., Versandkostenfrei

Beschreibung

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

18.06.2013

Herausgeber

Charles S. Barrett + weitere

Verlag

Springer Us

Seitenzahl

682

Maße (L/B/H)

25,4/17,8/3,8 cm

Gewicht

1326 g

Auflage

Softcover reprint of the original 1st ed. 1989

Sprache

Englisch

ISBN

978-1-4757-9112-9

Beschreibung

Produktdetails

Einband

Taschenbuch

Erscheinungsdatum

18.06.2013

Herausgeber

Verlag

Springer Us

Seitenzahl

682

Maße (L/B/H)

25,4/17,8/3,8 cm

Gewicht

1326 g

Auflage

Softcover reprint of the original 1st ed. 1989

Sprache

Englisch

ISBN

978-1-4757-9112-9

Herstelleradresse

Springer-Verlag KG
Sachsenplatz 4-6
1201 Wien
AT

Email: GPSR Kontakt

Noch keine Bewertungen vorhanden

Verfassen Sie die erste Bewertung zu diesem Artikel

Helfen Sie anderen Kundinnen und Kunden durch Ihre Meinung.

Kundinnen und Kunden meinen

Bewertungen (0)
  • Produktbild: Advances in X-Ray Analysis
  • I. High Brilliance Sources/Applications.- Synchrotron Radiation X-Ray Fluorescence Analysis.- X-Ray Diffraction Using Synchrotron Radiation — A Catalysis Perspective.- II. On-Line X-Ray Analysis.- On-Line X-Ray Fluorescence Spectrometer for Coating Thickness Measurements.- Process Control Applications of the Peltier Cooled SI(LI) Detector Based EDXRF Spectrometer.- Application of Fundamental Parameter Software to On-Line XRF Analysis.- On-Stream XRF Measuring System for Ore Slurry Analysis.- Applications of On-Line XRF and XRD Analysis Techniques to Industrial Process Control.- On-Site Tests of a New XRD/XRF On-Line Process Analyzer.- III. Xrf Mathematical Models and Quantitation.- Concepts of Influence Coefficients in XRF Analysis and Calibration.- Painless XRF Analysis Using New Generation Computer Programs.- Intensity and Distribution of Background X-Rays in a Wavelength-Dispersive Spectrometer. II. Applications.- What Can Data Analysis do for X-Ray Microfluorescence Analysis?.- The Determination of Rare Earth Elements in Geological Samples by XRF Using the Proportional Factor Method.- IV. Techniques And XRF Instrumentation.- How to Use the Features of Total Reflection of X-rays for Energy Dispersive XRF.- Applications of a Laboratory X-Ray Microprobe to Materials Analysis.- Development of Instrument Control Software for the SRS/300 Spectrometer on a VAX/730 Computer Running the VMS Operating System.- Instrumentation and Applications for Total Reflection X-Ray Fluorescence Spectrometry.- Micro X-Ray Fluorescence Analysis with Synchrotron Radiation.- X-Ray Microprobe Studies Using Multilayer Focussing Optics.- V. XRF Applications.- Resolution Enhancement for Cu K-alpha Emission of Y-Ba-Cu-O Compounds.- Chemical State Analysis by X-Ray Fluorescence Using Absorption Edges Shifts.- High Resolution X-Ray Fluorescence Si K? Spectra: A Possible New Method for the Determination of Free Silica in Airborne Dusts.- Quantitative Analysis of Fluorine and Oxygen by X-Ray Fluorescence Spectrometry Using a Layered Structure Analyzer.- The Homogeneity of Fe, Sr and Zr in SL-3/Lake Sediment Standard Reference Material by Radioisotope Induced X-Ray Emission..- Quantitative Analysis of Arsenic Element in a Trace of Water Using Total Reflection X-Ray Fluorescence Spectrometry.- Impurity Analysis of Silicon Wafers by Total Reflection X-Ray Fluorescence Analysis.- Sample Treatment for TXRF — Requirements and Prospects.- Sample Preparation Optimization for EDXRF Analysis of Portland Cement.- The Viability of XRF Determination of Gold in Mineral Reconnaissance.- An Improved Fusion Technique for Major-Element Rock Analysis by XRF.- Modern Alloy Analysis and Identification with a Portable X-Ray Analyzer.- Low Level Iodine Detection by TXRF Spectrometry.- The Application of P-32 and Sn-113 Radionuclides for the Determination of Noble Metals.- Characterization of Permalloy Thin Films via Variable Sample Exit Angle Ultrasoft X-Ray Fluorescence Spectrometry.- VI. Analysis of Thin Films by XRD and XRF.- X-Ray Diffraction Analysis of High Tc Superconducting Thin Films.- Thickness Measurement of Epitaxical Thin Films by X-Ray Diffraction Method.- Texture Analysis of Thin Films and Surface Layers by Low Incidence Angle X-Ray Diffraction.- Fast Thickness Measurement of Thin Crystalline Layers by Relative Intensities in XRPD Method.- X-Ray Diffraction of Thin Oxide Films on Soldered Module Pins.- X-Ray Diffraction Studies of Polycrystalline Thin Films Using Glancing Angle Diffractometry.- Density Measurement of Thin Sputtered Carbon Films.- Determination of Ultra-Thin Carbon Coating Thickness by X-Ray Fluorescence Technique.- VII. X-Ray Stress Analysis.- Separation of the Macro- and Micro-Stresses in Plastically Deformed 1080 Steel.- Effect of Plastic Deformation on Oscillations in “d” vs. Sin2? Plots A FEM Analysis.- X-Ray Diffractometric Determination of Lattice Misfit Between ? and ?’ Phases in Ni-Base Superalloys — Conventional X-Ray Source vs. Synchrotron Radiation.- Standard Deviations in X-Ray Stress and Elastic Constants Due to Counting Statistics.- Elastic Constants of Alloys Measured with Neutron Diffraction.- Stress Measurements with a Two-Dimensional Real-Time System.- Application of a New Solid State X-Ray Camera to Stress Measurement.- Advantages of the Vector Method to Study the Texture of Well-Textured Thin Layers.- Taking into Account the Texture Effect in the Measurement of Residual Stresses by Using the Vector Method of Texture Analysis.- X-Ray Diffraction Studies on Shock-Modified Y Ba2Cu3O7 Superconductors.- The Characterization of a Solid Sorbent with Crystallite Size and Strain Data from X-Ray Diffraction Line Broadening.- X-Ray Measurement of Grinding Residual Stress in Alumina Ceramics.- Residual Stresses Near SCC Fracture Surfaces of AISI 4340 Steel.- Residual Stress Measurement of Silicon Nitride and Silicon Carbide by X-Ray Diffraction Using Gaussian Curve Method.- Residual Stresses in Al2CO3/SiC (Whisker) Composites Containing Interfacial Carbon Films.- VIII. Applications of Digitized XRD Patterns.- Parallel Beam and Focusing Powder Diffractometry.- Chemical Constraints in Quantitative X-Ray Powder Diffraction for Mineral Analysis of the Sand/Silt Fractions of Sedimentary Rocks.- The Crystal Structures of the Cubic and Tetragonal Phases of Y1Ba3Cu2O6.5 + ?.- Using X-Ray Powder Diffraction to Determine the Structure of VPI-5 — A Molecular Sieve with the Largest Known Pores.- Optimizing the Calculation of Standardless Quantitative Analysis.- Shadow: A System for X-Ray Powder Diffraction Pattern Analysis.- IX. Qualitative and Quantitative Phase Analysis Diffraction Applications.- Specific Data Handling Techniques and New Enhancements in a Search/Match Program.- Use of the Crystal Data File on CD-ROM.- A Reference Database Retrieval System: Information as a Tool to Assist in XRD Phase Identification.- On the Selection of the Value for the Experimental Wavelength in Powder Diffraction Measurements.- Results of the JCPDS-ICDD Intensity Round Robin.- On the Preparation of Good Quality X-Ray Powder Patterns.- Semi-Quantitative XRD Analysis of Fly Ash Using Rutile as an Internal Standard.- Mechanically-Induced Phase Transformations in Plutonium Alloys.- The Determination of ?-Cristobalite in Airborne Dust by X-Ray Diffraction — Theory and Practice.- Automatic Computer Measurement of Selected Area Electron Diffraction Patterns from Asbestos Minerals.- Comparison of Experimental Techniques to Improve Peak to Background Ratios in X-Ray Powder Diffractometry.- X-Ray Diffraction Studies of Solid Solutions of Pentaglycerine-Neopentylglycol.- Simultaneous Thermal and Structural Measurements of Oriented Polymers by DSC/XRD Using an Area Detector.- Vacuum Free-Fall Method for Preparation of Randomly Oriented XRD Samples.- X. X-Ray Tomography, Imaging, and Topography.- Applications of Dual-Energy X-Ray Computed Tomography to Structural Ceramics.- Microtomography Detector Design: It’s Not Just Resolution.- Required Corrections for Analysis of Industrial Samples with Medical CT Scanners.- LM-ACT for Imaging RAM Devices in X-Ray Diffraction Topographs.- Author Index.